In the production of tantalum, niobium and their alloys, it is necessary to test the metallographic structure of tantalum, niobium and their alloys. The metallographic structure of tantalum, niobium and their alloys has been reported in literature and patent. Qiu Junfang puts forward a method of electrolytic polishing was prepared by cold deformation and recrystallization annealing of metallographic specimen of tantalum, niobium and its alloys, through the coarse grinding, cleaning, fine grinding, cleaning, polishing, etching steps, such as using sulfuric acid, nitric acid, hydrofluoric acid and deionized water, cleaning fluid and etching liquid, tantalum samples of tungsten alloy metallographic observation was successfully achieved. Firstly, chemical polishing was used to dissolve the deformation layer on the sample surface, and then the sample after chemical polishing was mechanically polished on a polishing machine. After the sample after mechanical polishing was immersed with corrosion solution, clear niobium hafnium alloy metallographic structure could be observed. The invention discloses a method for displaying the metallographic structure of tantalum or tantalum alloy target material. The sample is first sampled from the target material for grinding and polishing treatment, then the first etching solution is used for the first corrosion treatment of the sample, and then the second etching solution is used for the second corrosion treatment of the sample, and finally the sample is observed under a metallographic microscope.
The above methods are mainly divided into electrolytic polishing and mechanical polishing, including grinding, polishing, etching and other steps, among which grinding and polishing are the most time-consuming and labor-intensive steps in the metallographic detection process. In the case of a large number of metallographic detection products, it is difficult to achieve the purpose of batch and rapid detection. In addition, in the actual production of tantalum and niobium, it is necessary to carry out on-site metallographic detection on semi-finished or finished products without cutting samples, which is obviously difficult to do.
Below the implementation example of the invention technology schemes are clear and complete description, obviously, described the implementation of the cases are only part of the present invention, but not all cases, based on the example in the invention, the field common technical personnel under the premise that did not make a creative labor for all other cases, both within the protection scope of the present invention.
The invention is further explained below in combination with the attached drawings and concrete embodiments.
The foregoing are only better embodiments of the invention and do not constitute any formal restriction of the invention. Any simple modification, equivalent change or modification of the foregoing embodiments based on the technical substance of the invention shall still fall within the scope of the scheme of the invention.
